A power semiconductor may undergo damage due to____________?
A. High di/dt
B. High dv/dt
C. Low di/dt
D. Low dv/dt
A. High di/dt
B. High dv/dt
C. Low di/dt
D. Low dv/dt
A. of long period
B. of short duration
C. both (A) and (B)
D. neither (A) nor (B)
A. 20 A
B. 200 A
C. 600 A
D. 400 A
A. CB and fuse.
B. Heat sink.
C. Snubber circuit.
D. Voltage clamg device.
A. high value.
B. low value.
C. zero value.
D. moderate value.
A. UJT
B. Diac
C. Triac
D. SCR
A. low
B. High
C. moderate
D. infinity
A. 100 mA
B. 500 mA
C. 1 A
D. 2 A
A. Directly proportional to supply voltage
B. Directly proportional to inductance in the circuit
C. Inversely proportional to supply voltage
D. Both A and B
A. fast acting fuse
B. snubber circuit
C. metal oxide varistor
D. aluminium block